DocumentCode
262428
Title
22.1 A 90GS/s 8b 667mW 64× interleaved SAR ADC in 32nm digital SOI CMOS
Author
Kull, Lukas ; Toifl, Thomas ; Schmatz, Martin ; Francese, Pier Andrea ; Menolfi, Christian ; Braendli, Matthias ; Kossel, Marcel ; Morf, Thomas ; Andersen, Toke Meyer ; Leblebici, Yusuf
Author_Institution
IBM Res., Rüschlikon, Switzerland
fYear
2014
fDate
9-13 Feb. 2014
Firstpage
378
Lastpage
379
Abstract
Forthcoming optical communication standards such as ITU OTU-4 and 100/400Gb/s Ethernet require ADCs with more than 50GS/s and at least 5 ENOB to enable complex equalization in the digital domain. SAR ADCs and interleaved ADCs made impressive progress in recent years. First CMOS ADCs with at least 6b and conversion rates exceeding 20GS/s were presented, proving that interleaved SAR ADCs are an optimal choice for high-speed ADCs with moderate resolution. We present an interleaved CMOS ADC architecture based on an asynchronous redundant SAR ADC core element. It was measured up to a sampling rate of 100GS/s and can be operated from a single supply voltage. At 90GS/s, the measured SNDR stays above 36.0dB SNDR up to 6.1GHz and 33.0dB up to 19.9GHz input frequency while consuming 667mW. The ADC is implemented in 32nm digital SOI CMOS and occupies 0.45mm2.
Keywords
CMOS digital integrated circuits; analogue-digital conversion; silicon-on-insulator; analog-digital converter; digital SOI CMOS; high speed ADC; interleaved SAR ADC; moderate resolution ADC; optical communication; power 667 mW; size 32 nm; successive approximation register; Bandwidth; CMOS integrated circuits; Capacitors; Clocks; Frequency measurement; Linearity; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4799-0918-6
Type
conf
DOI
10.1109/ISSCC.2014.6757477
Filename
6757477
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