Title :
Ultrafast nonlinear optical response of confined exciton-polaritons in a semiconductor thin film
Author :
Isu, T. ; Akiyama, K. ; Tomita, N. ; Nishimura, T. ; Nomura, Y.
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
Abstract :
High efficient nonlinear optical responses with very fast recovery time (1.5 ps) was demonstrated for a weakly confined exciton system in precisely size-controlled GaAs thin films at the exciton resonance energy. The temporal profile of nonlinear response for the transient grating measurements revealed the effects of the excitonic polaritons in the film.
Keywords :
III-V semiconductors; diffraction gratings; excitons; gallium arsenide; high-speed optical techniques; multiwave mixing; nonlinear optics; optical switches; polaritons; semiconductor thin films; 1.5 ps; GaAs; GaAs thin films; confined exciton-polaritons; exciton resonance energy; excitonic polaritons; nonlinear optical responses; nonlinear response; recovery time; semiconductor thin film; size-controlled thin films; temporal profile; transient grating measurements; ultrafast nonlinear optical response; weakly confined exciton system; Excitons; Gallium arsenide; Nonlinear optics; Optical films; Optical mixing; Polarization; Probes; Pulse measurements; Semiconductor thin films; Ultrafast optics;
Conference_Titel :
Nonlinear Optics: Materials, Fundamentals, and Applications, 2000. Technical Digest
Conference_Location :
Kaua´i-Lihue, HI, USA
Print_ISBN :
1-55752-646-X
DOI :
10.1109/NLO.2000.883670
