• DocumentCode
    2625285
  • Title

    Thickness Dependence Of Tunneling Magnetoresistance Effect In Granular Fe-Al/sub 2/O/sub 3/ Films

  • Author

    Huang, Y.H. ; Hsu, J.H. ; Chen, J.W.

  • Author_Institution
    Dept. of Physics, National Taiwan University
  • fYear
    1997
  • fDate
    1-4 April 1997
  • Keywords
    Conductivity; Electrons; Insulation; Iron; Physics; Semiconductor films; Sputtering; Substrates; Temperature dependence; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
  • Conference_Location
    New Orleans, LA, USA
  • Print_ISBN
    0-7803-3862-6
  • Type

    conf

  • DOI
    10.1109/INTMAG.1997.597495
  • Filename
    597495
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2625285