Title :
Test And Failure Diagnosis Equipment For Home Bus Systems
Author :
Iizuka, S. ; Hamada, H. ; Asakura, T. ; Miwa, T.
Author_Institution :
Nippon Telegraph and Telephone Corp.
Keywords :
Circuit noise; Electromagnetic interference; Noise figure; Personnel; Protocols; Pulsed power supplies; System testing; Telegraphy; Telephony; Voltage;
Conference_Titel :
Consumer Electronics, 1993. Digest of Technical Papers. ICCE., IEEE 1993 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0843-3
DOI :
10.1109/ICCE.1993.697671
