• DocumentCode
    2626382
  • Title

    Sensitivity Analysis of Neural Network Parameters for Identifying the Factors for College Student Success

  • Author

    Karamouzis, Stamos T. ; Vrettos, Andreas

  • Author_Institution
    Regis Univ., Denver, CO, USA
  • Volume
    5
  • fYear
    2009
  • fDate
    March 31 2009-April 2 2009
  • Firstpage
    671
  • Lastpage
    675
  • Abstract
    Predicting student graduation rates in institutes of higher education is of great value to the institution and an enormous potential utility for targeted intervention. During the past decade a number of researchers applied various methodologies in order to predict enrollment rates, persistence rates, and/or graduation rates. In this paper we present the development and performance of an Artificial Neural Network (ANN) for predicting community college graduation outcomes as well as the results of applying sensitivity analysis on the ANN parameters in order to identify the factors that result into a successful graduation outcome. A sample of 1,407 student profiles was used to train and test our ANN. The average predictability rate for the ANNpsilas training and test sets were higher than any other reported in the literature (77% and 68%, respectively). The need for disability services, the need for support services, and the studentpsilas age at the time of application to the college were identified as the three factors most contributory to a successful/ unsuccessful graduation outcome.
  • Keywords
    educational administrative data processing; educational institutions; further education; neural nets; sensitivity analysis; artificial neural network; college student success; community college graduation; disability services; enrollment rates; higher education; neural network parameters; persistence rates; sensitivity analysis; student graduation rates; support services; targeted intervention; Artificial neural networks; Computer science; Computer science education; Drives; Economic forecasting; Educational institutions; Multilayer perceptrons; Neural networks; Sensitivity analysis; Testing; community colleges; neural networks; persistant rate; student graduation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Engineering, 2009 WRI World Congress on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    978-0-7695-3507-4
  • Type

    conf

  • DOI
    10.1109/CSIE.2009.592
  • Filename
    5170618