Title :
On the completeness of test cases for atomic arithmetic expressions
Author :
Tse, T.H. ; Chen, T.Y. ; Feng, X.
Author_Institution :
Hong Kong Univ., China
Abstract :
Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary
Keywords :
program testing; software quality; atomic arithmetic expressions; predicate statements; test cases completeness; weak mutation testing; Arithmetic; Australia; Computer aided software engineering; Computer science; Connectors; Councils; Genetic mutations; Information systems; Logic testing; Software testing;
Conference_Titel :
Quality Software, 2000. Proceedings. First Asia-Pacific Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-0825-1
DOI :
10.1109/APAQ.2000.883788