• DocumentCode
    262690
  • Title

    Welcome message

  • Author

    Purtell, Michael ; Mitra, Subhasish

  • Author_Institution
    Integrated Device Technology, USA
  • fYear
    2014
  • fDate
    20-23 Oct. 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    It is our privilege to welcome you to the 45th IEEE International Test Conference (ITC) sponsored by the IEEE Computer Society and the IEEE Philadelphia Section. This year the conference is being held in a new venue, the Washington State Convention Center in downtown Seattle, Washington during the week of October 20, 2014. In addition to learning opportunities, ITC is a great place to socialize with your professional colleagues in a fun-filled atmosphere, make new friends and catch up with people you already know.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2014 IEEE International
  • Conference_Location
    Seattle, WA, USA
  • Type

    conf

  • DOI
    10.1109/TEST.2014.7035248
  • Filename
    7035248
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=262690