Author :
Purtell, Michael ; Mitra, Subhasish
Author_Institution :
Integrated Device Technology, USA
Abstract :
It is our privilege to welcome you to the 45th IEEE International Test Conference (ITC) sponsored by the IEEE Computer Society and the IEEE Philadelphia Section. This year the conference is being held in a new venue, the Washington State Convention Center in downtown Seattle, Washington during the week of October 20, 2014. In addition to learning opportunities, ITC is a great place to socialize with your professional colleagues in a fun-filled atmosphere, make new friends and catch up with people you already know.
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA, USA
DOI :
10.1109/TEST.2014.7035248
