DocumentCode :
262715
Title :
ATE and test equipment vendors; Hardware not software
Author :
Roos, Mark
Author_Institution :
Roos Instruments, USA
fYear :
2014
fDate :
20-23 Oct. 2014
Firstpage :
1
Lastpage :
1
Abstract :
Adaptive test is a must have to be competitive in the future, and we need better data to support it, and that data has to come from the testers. Now, could someone please tell us how to do it? Because it seems that everyone wants AT, but only a few are willing to pay extra for it.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA, USA
Type :
conf
DOI :
10.1109/TEST.2014.7035291
Filename :
7035291
Link To Document :
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