• DocumentCode
    262794
  • Title

    Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

  • Author

    Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2014
  • fDate
    20-23 Oct. 2014
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. Reasoning techniques increase the accuracy of functional-fault diagnosis based on the history of successfully repaired boards. However, depending on the complexity of the product, it usually takes several months to accumulate an adequate database for training a reasoning-based diagnosis system. During the initial product ramp-up phase, reasoning-based diagnosis is not feasible for yield learning, since the required database is not available due to lack of volume. We propose a knowledge-discovery method and a knowledge-transfer method for facilitating board-level functional fault diagnosis. First, an analysis technique based on machine learning is used to discover knowledge from syndromes, which can be used for training a diagnosis engine. Second, knowledge from diagnosis engines used for earlier-generation products can be automatically transferred through root-cause mapping and syndrome mapping based on keywords and board-structure similarities. Two complex boards in volume production and with a mature diagnosis system, and three new boards in the ramp-up phase, are used to validate the proposed knowledge-discovery and knowledge-transfer approach in terms of the diagnosis accuracy obtained using the new diagnosis systems.
  • Keywords
    data mining; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit yield; printed circuits; board repair; board-level functional fault diagnosis; diagnosis engine; earlier-generation product; knowledge discovery method; knowledge transfer method; machine learning; manufacturing cost reduction; product ramp-up phase; product yield; reasoning technique; reasoning-based diagnosis system; root-cause mapping; syndrome mapping; yield learning; Application specific integrated circuits; Engines; Knowledge acquisition; Knowledge discovery; Knowledge transfer; Production; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2014 IEEE International
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/TEST.2014.7035335
  • Filename
    7035335