DocumentCode
262802
Title
Clustering-based failure triage for RTL regression debugging
Author
Poulos, Zissis ; Veneris, Andreas
Author_Institution
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear
2014
fDate
20-23 Oct. 2014
Firstpage
1
Lastpage
10
Abstract
Regression verification at the pre-silicon stage has experienced a dramatic boost in capabilities over the past years. With the aid of assertions, improved simulation coverage and formal verification tools, a vast amount of trace data and myriads of failures are often generated after each regression run. Along these lines, modern flows face an emerging need to appropriately categorize, prioritize and distribute these failures to the engineer(s) best-suited for detailed debugging of each failure. This task is known as failure triage. Despite its resource-intensive nature, triage remains a predominantly manual process. In this work, an automated data-mining failure triage framework is introduced that mines simulation and SAT-based design debugging data, uncovers relations among verification failures and automatically groups the related ones together. The core characteristic of the framework is a novel feature-based representation for verification failures and a new multiple-pass clustering strategy that surpass previous methodologies in accuracy, robustness and flexibility. The proposed triage engine achieves an 89% average accuracy in failure categorization and compared to existing solutions, it reduces the number of misplaced verification failures by 47% on the average.
Keywords
data mining; elemental semiconductors; flip-flops; logic design; regression analysis; silicon; RTL regression debugging; SAT-based design debugging data; Si; clustering-based failure triage; data-mining failure triage framework; formal verification tools; regression verification; simulation coverage; triage engine; Clustering algorithms; Debugging; Engines; Frequency measurement; Measurement uncertainty; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2014 IEEE International
Conference_Location
Seattle, WA
Type
conf
DOI
10.1109/TEST.2014.7035339
Filename
7035339
Link To Document