Nearfield-immunity scan on printed circuit board level

Author

Krö, Oliver ; Krause, Mario ; Leone, Marco

Author_Institution

Dept. of Theor. Electr. Eng., Otto-von-Guericke-Univ. Magdeburg, Magdeburg, Germany

fYear

2010

fDate

9-12 May 2010

Firstpage

101

Lastpage

102

Abstract

A new immunity scan method is presented for assessing the sensitivity of circuits in close proximity to the nearfield of noise emission sources. The measurement setup primarily consists of a positioning robot with a small field probe, feeded by a signal source and a power amplifier. A suitable calibration method to adjust the interference field strength is suggested. As an application example, the bit-error-ratio of a binary signal transmission is evaluated, depending on the interference field amplitude and the frequency.

Keywords

calibration; error statistics; interference; power amplifiers; printed circuit testing; printed circuits; robots; binary signal transmission; bit-error-ratio; calibration method; circuit sensitivity; interference field strength; nearfield-immunity scan; noise emission sources; positioning robot; power amplifier; printed circuit board level; signal source; Calibration; Circuit noise; Frequency; Interference; Position measurement; Power amplifiers; Power measurement; Printed circuits; Probes; Robot sensing systems;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on

Conference_Location

Hildesheim

Print_ISBN

978-1-4244-7611-4

Type

conf

DOI

10.1109/SPI.2010.5483560

Filename

5483560