Title :
Nearfield-immunity scan on printed circuit board level
Author :
Krö, Oliver ; Krause, Mario ; Leone, Marco
Author_Institution :
Dept. of Theor. Electr. Eng., Otto-von-Guericke-Univ. Magdeburg, Magdeburg, Germany
Abstract :
A new immunity scan method is presented for assessing the sensitivity of circuits in close proximity to the nearfield of noise emission sources. The measurement setup primarily consists of a positioning robot with a small field probe, feeded by a signal source and a power amplifier. A suitable calibration method to adjust the interference field strength is suggested. As an application example, the bit-error-ratio of a binary signal transmission is evaluated, depending on the interference field amplitude and the frequency.
Keywords :
calibration; error statistics; interference; power amplifiers; printed circuit testing; printed circuits; robots; binary signal transmission; bit-error-ratio; calibration method; circuit sensitivity; interference field strength; nearfield-immunity scan; noise emission sources; positioning robot; power amplifier; printed circuit board level; signal source; Calibration; Circuit noise; Frequency; Interference; Position measurement; Power amplifiers; Power measurement; Printed circuits; Probes; Robot sensing systems;
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
Conference_Location :
Hildesheim
Print_ISBN :
978-1-4244-7611-4
DOI :
10.1109/SPI.2010.5483560
