Title :
Fault sharing in a copy-on-write based ATPG system
Author :
Cai, X. ; Wohl, P. ; Martin, D.
Author_Institution :
Synopsys, Inc., Mountain View, CA, USA
Abstract :
We present a new fault data sharing scheme for a multi-core parallel ATPG system. This scheme effectively reduces the memory consumption by putting the fault data in shared memory. We discuss optimization opportunities and the new technical challenges. Experimental results are compared to the original highly efficient multicore ATPG system.
Keywords :
automatic test pattern generation; multiprocessing systems; optimisation; automatic test pattern generation; copy-on-write based ATPG system; fault data sharing scheme; memory consumption; multicore parallel ATPG system; Abstracts; Automatic test pattern generation; Multicore processing;
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA
DOI :
10.1109/TEST.2014.7035349
