Title :
Measurement of on-chip I/O power supply noise and correlation verification between noise magnitude and delay increase due to SSO
Author :
Takai, Yasumichi ; Ogasahara, Yasuhiro ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
Abstract :
This paper presents measurement results of on-chip noise on power and ground rings for I/O (input/output) cells in a simple test structure fabricated in 90nm process. We also show measured timings of an output signal from chip to PCB board, and examine the relation between the magnitude of I/O power supply noise and the output transition timings.
Keywords :
Clocks; Delay; Noise measurement; Phase locked loops; Pins; Power measurement; Power supplies; Probes; Semiconductor device measurement; Timing;
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
Conference_Location :
Hildesheim, Germany
Print_ISBN :
978-1-4244-7611-4
DOI :
10.1109/SPI.2010.5483591
