• DocumentCode
    2628714
  • Title

    Logo recognition using geometric invariants

  • Author

    Doermann, David S. ; Rivlin, Ehud ; Weiss, Isaac

  • Author_Institution
    Center for Autom. Res., Maryland Univ., College Park, MD, USA
  • fYear
    1993
  • fDate
    20-22 Oct 1993
  • Firstpage
    894
  • Lastpage
    897
  • Abstract
    The problem of logo recognition is of great interest in the document domain, especially for databases, because of its potential for identifying the source of the document and its generality as a recognition problem. By recognizing the logo, one obtains semantic information about the document, which may be useful in deciding whether or not to analyze the textual components. A multi-level stages approach to logo recognition which uses global invariants to prune the database and local affine invariants to obtain a more refined match is presented. An invariant signature which can be used for matching under a variety of transformations is obtained. The authors provide a method of computing Euclidean invariants and show how to extend them to capture similarity, affine, and projective invariants when necessary. They implement feature detection, feature extraction, and local invariant algorithms and successfully demonstrate the approach on a small database
  • Keywords
    document handling; feature extraction; image recognition; object recognition; visual databases; Euclidean invariants; affine invariants; databases; document domain; feature detection; feature extraction; geometric invariants; global invariants; invariant signature; local affine invariants; local invariant algorithms; logo recognition; multi-level stages; projective invariants; semantic information; similarity invariants; textual components; Automation; Character recognition; Computer vision; Educational institutions; Feature extraction; Graphics; Image databases; Indexing; Object detection; Spatial databases;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on
  • Conference_Location
    Tsukuba Science City
  • Print_ISBN
    0-8186-4960-7
  • Type

    conf

  • DOI
    10.1109/ICDAR.1993.395593
  • Filename
    395593