The Correction of Aberration on Measurement Based on Image

In the planar measurement based on image, the size of objects´ image cannot keep linearity with their real size due to the aberration of lens and CCD. This paper use a new simple method to eliminate them. Firstly, the coordinate system are set and their transforms are modeled. Then, a separating parameter method is provided to simplified the course of measurement. So several separated parameters needed in measurement are acquired and the image are corrected using those parameters. Thought the proportional relations built by them, the measurement based on image can be completed. The largest distortion of the image is about 7 pixels, after correction, it decreased to 0.6 pixels, and relative distortion converted from 1.2% to 0.1%. Compared to other measurement methods, the method used in this paper involves in less parameters which are independent each other and simpler calculation process. It can be adopted to all of the CCD´s surface imaging measurement about planar images.