• DocumentCode
    2628991
  • Title

    Investigation of growth conditions of CdTe thick films on properties and demands for X-ray detector applications

  • Author

    Sorgenfrei, R. ; Greiffenberg, D. ; Fiederle, M.

  • Author_Institution
    Freiburger Materialforschungszentrum (FMF), Albert-Ludwigs-Universitÿt Freiburg, Stefan-Meier-Strasse 21, D-79104 Germany
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    138
  • Lastpage
    142
  • Abstract
    CdTe thick films were prepared by vacuum deposition on amorphous substrates using MBE technique. The growth was performed at different temperatures to investigate the development of the growth rate, surface morphology, structure and optical properties. Properties of films deposited with a single CdTe source are compared with films grown with an additional Cd source. The growth experiments are discussed with regard to demands for X-ray detector applications.
  • Keywords
    Biomedical optical imaging; Optical films; Readout electronics; Semiconductor films; Substrates; Surface morphology; Temperature distribution; Thick films; X-ray detection; X-ray detectors; CdTe; direct growth; polycrystalline; thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4775140
  • Filename
    4775140
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2628991