Title :
A functional classification approach to layout analysis of document images
Author :
Iwane, Kazumi ; Yamaoka, Masaki ; Iwaki, Osamu
Author_Institution :
NTT Data Communications Systems Corp., Kawasaki, Kanagawa, Japan
Abstract :
Layout analysis is both the segmentation and labeling of document images for automatic document input systems. The authors propose a layout analysis method based on a pattern classification scheme. They define the feature space in terms of low-level image processing features such as connected components and projection profiles. The classifier assigns each connected component its logical label according to its features. Publication specific information is kept in the reference vector dictionary. An experiment using technical journal title pages gives connected component level recognition rates of 95% and 81% for learning and unknown samples, respectively
Keywords :
document image processing; feature extraction; image classification; image segmentation; automatic document input systems; connected components; document images; feature space; functional classification approach; labeling; layout analysis; learning; low-level image processing features; pattern classification scheme; projection profiles; publication-specific information; reference vector dictionary; segmentation; technical journal title pages; unknown samples; Character recognition; Humans; Image analysis; Image databases; Image segmentation; Labeling; Machine learning; Pattern analysis; Pattern classification; Text analysis;
Conference_Titel :
Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on
Conference_Location :
Tsukuba Science City
Print_ISBN :
0-8186-4960-7
DOI :
10.1109/ICDAR.1993.395622
