Title :
X-ray spectroscopy based on polycrystalline diamond
Author :
Girolami, M. ; Allegrini, P. ; Salvatori, S. ; Conte, G. ; Spiriti, E. ; Ralchenko, V.
Author_Institution :
Department of Electronic Engineering, University Roma Tre, CNISM, Italy
Abstract :
Detectors suitable for x-ray spectroscopy were realized and tested. Thick columnar samples fabricated from mechanically polished diamond deposits were selected for devices development. Grid and micro-strip structures were tested with the aim of reducing the coupling capacitances and to allow characterization tests in planar and sandwich configuration.
Keywords :
Conducting materials; Electric resistance; Energy resolution; Grain size; Monitoring; Spectroscopy; Surface morphology; Testing; Thermal conductivity; Thermal resistance;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2008.4775156
