DocumentCode
2629280
Title
X-ray spectroscopy based on polycrystalline diamond
Author
Girolami, M. ; Allegrini, P. ; Salvatori, S. ; Conte, G. ; Spiriti, E. ; Ralchenko, V.
Author_Institution
Department of Electronic Engineering, University Roma Tre, CNISM, Italy
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
227
Lastpage
234
Abstract
Detectors suitable for x-ray spectroscopy were realized and tested. Thick columnar samples fabricated from mechanically polished diamond deposits were selected for devices development. Grid and micro-strip structures were tested with the aim of reducing the coupling capacitances and to allow characterization tests in planar and sandwich configuration.
Keywords
Conducting materials; Electric resistance; Energy resolution; Grain size; Monitoring; Spectroscopy; Surface morphology; Testing; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4775156
Filename
4775156
Link To Document