DocumentCode
2629492
Title
On-chip tetrode JFET for RT X-ray spectroscopy: New results
Author
Fazzi, Alberto ; Boggini, Rocco ; Corli, Luca ; Dalla Stella, Simone ; Silocchi, Paolo ; Varoli, Vincenzo ; Dalla Betta, Gian-Franco ; Pignatel, Giorgio U.
Author_Institution
Department of Energy - CeSNEF of the Politecnico di Milano, via Ponzio 34/3, Italy, I-20233
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
272
Lastpage
275
Abstract
A spectroscopy system, that consists of a 0.8 mm 2 PiN diode coupled to a 100/6 circular N-channel JFET, has been fully tested at room temperature. The energy resolution on the 26.34 keV line is 430 eV FWHM at 3 us shaping time and, at - 5°C, 330 keV at 10 us. The system is ready for the specific applications for which an integrated front-end transistor is needed, but a complete front-end integrated circuit is not viable.
Keywords
Application specific integrated circuits; Diodes; Energy resolution; Integrated circuit technology; Nuclear and plasma sciences; Silicon; Spectroscopy; System testing; System-on-a-chip; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4775167
Filename
4775167
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