• DocumentCode
    2629714
  • Title

    Dynamic performance of a STATCOM under grid disturbances for two different linear controllers

  • Author

    Rodríguez, J. Valero ; Peña, E. Bueno ; Larrea, P. Ledesma ; Duarte, H. Amarís ; Rodríguez, A.

  • Author_Institution
    Electr. Eng. Dept., Carlos III Univ. of Madrid, Leganes, Spain
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    356
  • Lastpage
    361
  • Abstract
    The aim of this paper is to present a comparative stability study between vectorial control (VC) and power-synchronization control (PSC) related to a STATCOM under different grid disturbances. Both of them are linear control methods of grid-connected voltage source converters (VSC´s). VC is a very well known control method based on the dq decomposition to control the instantaneous active and reactive power independently. On the other hand, PSC is a novel method which uses the internal synchronization mechanism in AC systems, similar to the operation of a synchronous machine [1], [2]. By using this type of control, the VSC avoids the instability caused by a phase-locked loop (PLL) in weak AC systems [1]. The comparison between both control methods is verified through time simulations in the discrete domain under several grid disturbances as active and reactive power steps, grid impedance steps and voltage dips.
  • Keywords
    phase locked loops; power convertors; power grids; power system faults; reactive power control; static VAr compensators; synchronous machines; AC systems; STATCOM; comparative stability; discrete domain; dq decomposition; grid disturbances; grid impedance steps; grid-connected voltage source converters; instantaneous active power control; internal synchronization; linear controllers; phase-locked loop; power synchronization control; reactive power control; synchronous machine; vectorial control; voltage dips; Impedance; Power conversion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Montreal, QC
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4673-2419-9
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2012.6388620
  • Filename
    6388620