DocumentCode :
2630155
Title :
Development of radiation detectors based on semi-insulating silicon carbide
Author :
Ruddy, Frank H. ; Seidel, John G. ; Flammang, Robert W. ; Singh, Ranbir ; Schroeder, John
Author_Institution :
Westinghouse Electric Co. Science and Technology Department, 1332 Beulah Road, Pittsburgh, PA 15235-5081 USA
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
449
Lastpage :
455
Abstract :
Fast-neutron detectors based on high-purity semi-insulating 4H silicon carbide (SiC) semiconductor have been fabricated and tested. The response characteristics of these detectors have been compared with those of epitaxial 4H-SiC Schottky diode detectors. The charge collection efficiency has been tested using alpha particles and the fast-neutron response has been tested with 14-MeV and 2.5-MeV neutrons. Over the applied voltage range tested, the charge collection efficiency for alpha particles is generally lower for the semi-insulating SiC detectors, and the fast-neutron detection efficiencies are also lower. Both the lower charge collection efficiency and the lower fast-neutron detection efficiencies are primarily caused by charge recombination in combination with the low electric fields across the thicker semi-insulating SiC detectors and the inability of the detector packaging to adequately withstand high voltages. Semiinsulating SiC detectors provide a viable alternative to epitaxial SiC diode detectors for fast-neutron detection and methods to improve the performance of semi-insulating SiC detectors are proposed.
Keywords :
Alpha particles; Envelope detectors; Neutrons; Packaging; Radiation detectors; Radiative recombination; Schottky diodes; Semiconductor device testing; Silicon carbide; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775205
Filename :
4775205
Link To Document :
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