Fabrication and test of pixelated CZT detectors with different pixel pitches and thicknesses

Author

Li, Qiang ; Garson, Alfred III ; Dowkontt, Paul ; Martin, Jerrad ; Beilicke, Matthias ; Jung, Ira ; Groza, Michael ; Burger, Arnold ; De Geronimo, G. ; Krawczynski, Henrie

Author_Institution

Dept. of Physics and the McDonnell Center for the Space Sciences, Washington University in St. Louis, 1 Brookings Dr., CB 1105, St Louis, MO 63130, USA

fYear

2008

fDate

19-25 Oct. 2008

Firstpage

484

Lastpage

489

Abstract

The main methods grown Cadmium Zinc Telluride (CZT) crystals with high yield and excellent homogeneity are Modified Horizontal Bridgman (MHB) and High Pressure Bridgman (HPB) processes, respectively. In this contribution, the readout system based on two 32-channel NCI-ASICs for pixelated CZT detector arrays has been developed and tested. The CZT detectors supplied by Orbotech (MHB) and eV products (HPB) are tested by NCI-ASIC readout system. The CZT detectors have an array of 8×8 or 11×11 pixel anodes fabricated on the anode surface with the area up to 2 cm × 2 cm and the thickness of CZT detectors ranges from 0.5 cm to 1 cm. Energy spectra resolution and electron mobility-lifetime products of 8×8 pixels CZT detector with different thicknesses have been investigated.

Keywords

Anodes; Cadmium compounds; Crystals; Detectors; Electron mobility; Energy resolution; Fabrication; Sensor arrays; System testing; Zinc compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE

Conference_Location

Dresden, Germany

ISSN

1095-7863

Print_ISBN

978-1-4244-2714-7

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2008.4775212

Filename

4775212