Title :
Nonlinear optics of random metal-dielectric films
Author :
Shalaev, Vladimir M. ; Sarychev, A.K.
Author_Institution :
Dept. of Phys., New Mexico State Univ., Las Cruces, NM, USA
Abstract :
The optical properties of random metal-dielectric thin films (referred also to as semicontinuous metal films) are of great interest, in large part because of their high potential for various applications. Two-dimensional (2d) semicontinuous metal films are usually produced by thermal evaporation or sputtering of metal onto an insulating (dielectric) substrate. In the growing process small metallic grains are formed on the substrate first. As the film grows, the metal concentration increases and coalescences occur, so that irregularly shaped clusters are formed on the substrate eventually resulting in 2d fractal structures. At the percolation threshold, the sizes of the fractal structures diverge and a continuous conducting path of metal appears between the ends of the sample. At higher surface coverage, the film is mostly metallic, with voids of irregular fractal shapes. As further coverage increases, the film becomes uniform. We calculated the field distributions on a semicontinuous film at the fundamental and generated (in nonlinear optical processes) frequencies using a very effective numerical method based on the real space renormalization group (RSRG) approach. Our RSRG calculations demonstrate the large fluctuations for the intensity of the local electric fields
Keywords :
dielectric thin films; discontinuous metallic thin films; nonlinear optics; numerical analysis; optical harmonic generation; optical losses; silver; Ag; coalescences; continuous conducting path; dielectric substrate; field distributions; fluctuations; fractal structures; insulating substrate; irregular fractal shape; irregularly shaped clusters; local electric field intensity; metal concentration; nonlinear optical processes; nonlinear optics; numerical method; optical properties; percolation threshold; random metal-dielectric films; random metal-dielectric thin films; real space renormalization group; semicontinuous film; semicontinuous metal films; small metallic grains; sputtering; surface coverage; thermal evaporation; Dielectric substrates; Dielectric thin films; Dielectrics and electrical insulation; Fluctuations; Fractals; Frequency; Nonlinear optics; Optical films; Shape; Sputtering;
Conference_Titel :
Nonlinear Optics '98: Materials, Fundamentals and Applications Topical Meeting
Conference_Location :
Kauai, HI
Print_ISBN :
0-7803-4950-4
DOI :
10.1109/NLO.1998.710161