DocumentCode :
2630537
Title :
Proposal and analysis of gate drive circuit suitable for GaN-FET
Author :
Hattori, Fumiya ; Yamamoto, Masayoshi
Author_Institution :
Power Electron. Lab., Shimane Univ., Matsue, Japan
fYear :
2012
fDate :
25-28 Oct. 2012
Firstpage :
685
Lastpage :
690
Abstract :
This paper proposes a novel gate-drive circuit suitable for the GaNFET. The gate-drive makes GaNFET turn-off sufficiently and also reduce a loss in the reverse conduction time which the reverse drain-source current flows to GaNFET at off-state. Moreover, the losses caused by the recovery phenomenon are compared the proposed gate-drive circuit with the conventional gate-drive circuit. In addition, a detailed loss analysis of the proposed gate-drive circuit is stated in this paper. Furthermore, the validity of the proposed circuit is evaluated and discussed from the experimental point of view.
Keywords :
III-V semiconductors; driver circuits; field effect transistors; gallium compounds; wide band gap semiconductors; GaN; GaN-FET; gate drive circuit; reverse conduction; reverse drain-source current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
ISSN :
1553-572X
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2012.6388669
Filename :
6388669
Link To Document :
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