DocumentCode
2630872
Title
Development of SAXS microtomography and related methods
Author
Kuhlmann, M. ; Feldkamp, J.M. ; Roth, S.V. ; Schroer, C.G.
Author_Institution
Deutsches Elektronen Synchrotron, Notkestr. 85, Hamburg, Germany
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
570
Lastpage
573
Abstract
Small-angle x-ray scattering (SAXS) is a standard method for non-destructive structure analysis on the nanometer scale with synchrotron radiation. Many soft condensed matter materials (e.g. natural fibers, polymer fibers, wood, polymer parts) are nanostructured, and their macroscopic properties are a result of this structure. Frequently the nanostructure varies across the specimen under investigation. For these samples the combination of SAXS with microtomography opens up new possibilities for non-destructive studies of complex materials. The result is a mosaic of SAXS patterns, which are associated with defined volume elements in the specimen. These reconstructed patterns can be analyzed in order to track the variation of nanostructure inside the sample. Experimental details and results are illustrated in various examples.
Keywords
Chemical analysis; Focusing; Optical recording; Optical refraction; Optical scattering; Optical sensors; Particle scattering; Synchrotron radiation; Tomography; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4775243
Filename
4775243
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