• DocumentCode
    2630872
  • Title

    Development of SAXS microtomography and related methods

  • Author

    Kuhlmann, M. ; Feldkamp, J.M. ; Roth, S.V. ; Schroer, C.G.

  • Author_Institution
    Deutsches Elektronen Synchrotron, Notkestr. 85, Hamburg, Germany
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    570
  • Lastpage
    573
  • Abstract
    Small-angle x-ray scattering (SAXS) is a standard method for non-destructive structure analysis on the nanometer scale with synchrotron radiation. Many soft condensed matter materials (e.g. natural fibers, polymer fibers, wood, polymer parts) are nanostructured, and their macroscopic properties are a result of this structure. Frequently the nanostructure varies across the specimen under investigation. For these samples the combination of SAXS with microtomography opens up new possibilities for non-destructive studies of complex materials. The result is a mosaic of SAXS patterns, which are associated with defined volume elements in the specimen. These reconstructed patterns can be analyzed in order to track the variation of nanostructure inside the sample. Experimental details and results are illustrated in various examples.
  • Keywords
    Chemical analysis; Focusing; Optical recording; Optical refraction; Optical scattering; Optical sensors; Particle scattering; Synchrotron radiation; Tomography; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4775243
  • Filename
    4775243