DocumentCode :
2631121
Title :
Feedback pattern recognition by inverse recall neural network model
Author :
Yamada, Keiji
Author_Institution :
NEC Corp., Kawasaki, Japan
fYear :
1993
fDate :
20-22 Oct 1993
Firstpage :
254
Lastpage :
257
Abstract :
A feedback pattern recognition method based on an inverse recall neural network model is proposed. The model is a kind of multi-layer feedforward model. This model has three functional components. First is a recognition result generation according to a feedforward process in a multi-layer model. Another component calculates an uncertainty score from the output values. If the uncertainty score is greater than a threshold value, the last component, that is an inverse recall, operates. The inverse recall function produces changes in input values, in order to reduce the uncertainty score. The changes show input parts which are important for more certain recognition but are missed in the input pattern. The feedback method can adjust feature extraction parameters so as to detect the important features shown by the inverse recall network model. Then, features are extracted again by using the modified feature extraction parameter values. These feedforward and feedback processings are repeated until a certain recognition result is obtained. This method was examined for handwritten alpha-numeric recognition and it was found that a rejection ratio can be reduced at the same substitution error ratio
Keywords :
feature extraction; feedforward neural nets; handwriting recognition; optical character recognition; pattern recognition; feature extraction parameters; feedback; feedback method; feedback pattern recognition method; feedforward; handwritten alpha-numeric recognition; inverse recall neural network model; multi-layer feedforward model; output values; rejection ratio; substitution error ratio; threshold value; uncertainty score; Feature extraction; Handwriting recognition; Information technology; Inverse problems; Laboratories; National electric code; Neural networks; Neurofeedback; Pattern recognition; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on
Conference_Location :
Tsukuba Science City
Print_ISBN :
0-8186-4960-7
Type :
conf
DOI :
10.1109/ICDAR.1993.395737
Filename :
395737
Link To Document :
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