DocumentCode :
2631412
Title :
Comparing ODEP and DEP forces for micro/nano scale manipulation: A theoretical analysis
Author :
Wang, Shu-E ; Li, Ming-Lin ; Dong, Zai-Li ; Qu, Yan-Li ; Li, Wen J.
Author_Institution :
State Key Lab. of Robot., Chinese Acad. of Sci. (CAS), Shenyang, China
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
1174
Lastpage :
1179
Abstract :
This paper presents a theoretical investigation to evaluate and compare the capabilities of using dielectrophoresis (DEP) and optical image-driven dielectrophoresis (ODEP) forces for micro/nano scale manipulation. A simplified model of particle velocity as a function of electrode size and particle radius was derived based on Stokes´ law. Then, electric field analysis of two typical electrode configurations for DEP and ODEP manipulation was conducted under the same applied AC power and electrode dimension. Our results indicate that compared to DEP, ODEP provides much higher dominant force for micro/nano particle manipulation due to its Gaussian distribution of the light beam. Moreover, with only Brownian effect, theoretical results indicate that the minimum radius of particles that ODEP can manipulate has a close dependence on the virtual electrode size. ODEP can manipulate nano particles down to 2nm when the spot size down to 1μm.
Keywords :
Brownian motion; Gaussian distribution; electrophoresis; nanotechnology; particle size; Brownian effect; Gaussian distribution; Stokes law; applied AC power; dielectrophoresis force; electric field analysis; electrode configurations; electrode dimension; electrode size; microscale manipulation; nanoscale manipulation; optical image-driven dielectrophoresis force; particle radius; particle velocity; Electric fields; Electrodes; Force; Laser beams; Nanobioscience; Optical imaging; Optical refraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5721892
Filename :
5721892
Link To Document :
بازگشت