• DocumentCode
    2631412
  • Title

    Comparing ODEP and DEP forces for micro/nano scale manipulation: A theoretical analysis

  • Author

    Wang, Shu-E ; Li, Ming-Lin ; Dong, Zai-Li ; Qu, Yan-Li ; Li, Wen J.

  • Author_Institution
    State Key Lab. of Robot., Chinese Acad. of Sci. (CAS), Shenyang, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    1174
  • Lastpage
    1179
  • Abstract
    This paper presents a theoretical investigation to evaluate and compare the capabilities of using dielectrophoresis (DEP) and optical image-driven dielectrophoresis (ODEP) forces for micro/nano scale manipulation. A simplified model of particle velocity as a function of electrode size and particle radius was derived based on Stokes´ law. Then, electric field analysis of two typical electrode configurations for DEP and ODEP manipulation was conducted under the same applied AC power and electrode dimension. Our results indicate that compared to DEP, ODEP provides much higher dominant force for micro/nano particle manipulation due to its Gaussian distribution of the light beam. Moreover, with only Brownian effect, theoretical results indicate that the minimum radius of particles that ODEP can manipulate has a close dependence on the virtual electrode size. ODEP can manipulate nano particles down to 2nm when the spot size down to 1μm.
  • Keywords
    Brownian motion; Gaussian distribution; electrophoresis; nanotechnology; particle size; Brownian effect; Gaussian distribution; Stokes law; applied AC power; dielectrophoresis force; electric field analysis; electrode configurations; electrode dimension; electrode size; microscale manipulation; nanoscale manipulation; optical image-driven dielectrophoresis force; particle radius; particle velocity; Electric fields; Electrodes; Force; Laser beams; Nanobioscience; Optical imaging; Optical refraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5721892
  • Filename
    5721892