Title :
Characterization of Packaged Varactor Diodes
Author :
Young S.Lee ; Getsinger, W.J.
Abstract :
A method is presented for determining true junction capacitance and resistance, and all package equivalent circuit element values of varactor diodes from measurements of total capacitance and microwave impedance with bias.
Keywords :
Capacitance measurement; Diodes; Electrical resistance measurement; Impedance measurement; Measurement standards; Microwave circuits; Microwave measurements; Microwave theory and techniques; Packaging; Varactors;
Conference_Titel :
Microwave Symposium Digest, 1971 IEEE GMTT International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/GMTT.1971.1122894