• DocumentCode
    2631998
  • Title

    MUSE: robust surface fitting using unbiased scale estimates

  • Author

    Miller, James V. ; Stewart, Charles V.

  • Author_Institution
    Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    1996
  • fDate
    18-20 Jun 1996
  • Firstpage
    300
  • Lastpage
    306
  • Abstract
    Despite many successful applications of robust statistics, they have yet to be completely adapted to many computer vision problems. Range reconstruction, particularly in unstructured environments, requires a robust estimator that not only tolerates a large outlier percentage but also tolerates several discontinuities, extracting multiple surfaces in an image region. Observing that random outliers and/or points from across discontinuities increase a hypothesized fit´s scale estimate (standard deviation of the noise), our new operator; called MUSE (Minimum Unbiased Scale Estimator), evaluates a hypothesized fit over potential inlier sets via an objective function of unbiased scale estimates. MUSE extracts the single best fit from the data by minimizing its objective function over a set of hypothesized fits and can sequentially extract multiple surfaces from an image region. We show MUSE to be effective on synthetic data modelling small scale discontinuities and in preliminary experiments on complicated range data
  • Keywords
    computer vision; image reconstruction; surface fitting; MUSE; complicated range data; computer vision problems; image region; minimum unbiased scale estimator; multiple surfaces; objective function; range reconstruction; robust estimator; robust surface fitting; scale estimate; synthetic data modelling; unbiased scale estimates; Application software; Bridges; Computer vision; Data mining; Economic indicators; Image reconstruction; Robustness; Surface fitting; Surface reconstruction; World Wide Web;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 1996. Proceedings CVPR '96, 1996 IEEE Computer Society Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    0-8186-7259-5
  • Type

    conf

  • DOI
    10.1109/CVPR.1996.517089
  • Filename
    517089