Electro-optical measurement system for the DC characterization of visible detectors for CMOS compatible CNN vision chips

Author

Roca, Elisenda ; Frutos, Fabán ; Espejo, Servando ; Domínguez-Castro, Rafael ; Rodríguez-Vázquez, Angel

Author_Institution

Inst. de Microelectron., Seville Univ., Spain

fYear

1998

fDate

14-17 Apr 1998

Firstpage

282

Lastpage

287

Abstract

An electro-optical measurement system for the DC characterization of visible detectors for CMOS compatible CNN chips is presented which can help designers to characterize these detectors. The measurement system has been designed to be versatile, fast and easily expandable and used. Two different set-up´s for the measurement of the spectral response and the optical dynamic range of the detectors are described in detailed. Measurements of the spectral response are done with a fully computer controlled set-up, avoiding tedious and inaccurate measurements. A description of the different detectors available in a CMOS process is also given, together with the parameters affecting their response and a set of test structures which can be useful for the characterization of the detectors

Keywords

CMOS analogue integrated circuits; cellular neural nets; computer vision; electro-optical devices; image sensors; neural chips; photodetectors; CMOS compatible imagers; CNN vision chips; DC characterization; computer controlled set-up; electro-optical measurement system; optical dynamic range; photosensors; spectral response; test structures; visible detectors; CMOS process; CMOS technology; Cellular neural networks; Detectors; Electromagnetic measurements; Optical signal processing; Semiconductor device measurement; Semiconductor device modeling; Signal processing; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Cellular Neural Networks and Their Applications Proceedings, 1998 Fifth IEEE International Workshop on

Conference_Location

London

Print_ISBN

0-7803-4867-2

Type

conf

DOI

10.1109/CNNA.1998.685388

Filename

685388