• DocumentCode
    2632298
  • Title

    Analog circuit verification by statistical model checking

  • Author

    Wang, Ying-Chih ; Komuravelli, Anvesh ; Zuliani, Paolo ; Clarke, Edmund M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2011
  • fDate
    25-28 Jan. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We show how statistical Model Checking can be used for verifying properties of analog circuits. As integrated circuit technologies scale down, manufacturing variations in devices make analog designs behave like stochastic systems. The problem of verifying stochastic systems is often difficult because of their large state space. Statistical Model Checking can be an efficient verification technique for stochastic systems. In this paper, we use sequential statistical techniques and model checking to verify properties of analog circuits in both the temporal and the frequency domain. In particular, randomly sampled system traces are sequentially generated by SPICE and passed to a trace checker to determine whether they satisfy a given specification, until the desired statistical strength is achieved.
  • Keywords
    SPICE; analogue integrated circuits; formal verification; integrated circuit manufacture; statistical analysis; stochastic processes; SPICE; analog circuit property verification; frequency domain property; integrated circuit technology; large state space; sequential statistical technique; statistical model checking; stochastic system; temporal domain property; Analog circuits; Estimation; Frequency domain analysis; Probability; SPICE; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4244-7515-5
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2011.5722168
  • Filename
    5722168