DocumentCode :
2632298
Title :
Analog circuit verification by statistical model checking
Author :
Wang, Ying-Chih ; Komuravelli, Anvesh ; Zuliani, Paolo ; Clarke, Edmund M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2011
fDate :
25-28 Jan. 2011
Firstpage :
1
Lastpage :
6
Abstract :
We show how statistical Model Checking can be used for verifying properties of analog circuits. As integrated circuit technologies scale down, manufacturing variations in devices make analog designs behave like stochastic systems. The problem of verifying stochastic systems is often difficult because of their large state space. Statistical Model Checking can be an efficient verification technique for stochastic systems. In this paper, we use sequential statistical techniques and model checking to verify properties of analog circuits in both the temporal and the frequency domain. In particular, randomly sampled system traces are sequentially generated by SPICE and passed to a trace checker to determine whether they satisfy a given specification, until the desired statistical strength is achieved.
Keywords :
SPICE; analogue integrated circuits; formal verification; integrated circuit manufacture; statistical analysis; stochastic processes; SPICE; analog circuit property verification; frequency domain property; integrated circuit technology; large state space; sequential statistical technique; statistical model checking; stochastic system; temporal domain property; Analog circuits; Estimation; Frequency domain analysis; Probability; SPICE; Testing; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location :
Yokohama
ISSN :
2153-6961
Print_ISBN :
978-1-4244-7515-5
Type :
conf
DOI :
10.1109/ASPDAC.2011.5722168
Filename :
5722168
Link To Document :
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