DocumentCode
2632426
Title
Computer-Aided Characterization of Millimeter-Wave Semiconductor Devices
Author
Kuno, H.J. ; Fong, T.T. ; English, D.L.
fYear
1971
fDate
16-19 May 1971
Firstpage
122
Lastpage
123
Abstract
A new, improved characterization technique for evaluating semiconductor devices at millimeter-wave frequencies is described. By this technique both passive and active parameters of the device (e.g. , series resistance, junction capacitance, negative resistance) , and also the circuit parasitic can be characterized accurately.
Keywords
Circuit testing; Equivalent circuits; Frequency measurement; Impedance; Measurement techniques; Millimeter wave measurements; Millimeter wave technology; Resonance; Semiconductor devices; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1971 IEEE GMTT International
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/GMTT.1971.1122930
Filename
1122930
Link To Document