Title :
Computer-Aided Characterization of Millimeter-Wave Semiconductor Devices
Author :
Kuno, H.J. ; Fong, T.T. ; English, D.L.
Abstract :
A new, improved characterization technique for evaluating semiconductor devices at millimeter-wave frequencies is described. By this technique both passive and active parameters of the device (e.g. , series resistance, junction capacitance, negative resistance) , and also the circuit parasitic can be characterized accurately.
Keywords :
Circuit testing; Equivalent circuits; Frequency measurement; Impedance; Measurement techniques; Millimeter wave measurements; Millimeter wave technology; Resonance; Semiconductor devices; Semiconductor diodes;
Conference_Titel :
Microwave Symposium Digest, 1971 IEEE GMTT International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/GMTT.1971.1122930
