Title :
Comparative of software-based hardening techniques for LEON 3 microprocessor
Author :
Parra, Luis ; Lindoso, Almudena ; Entrena, Luis
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
Abstract :
This work evaluates several software-based hardening techniques for LEON 3 microprocessor in order to test their effectiveness in a detailed way. Hardening techniques are usually evaluated only with respect to SEUs in very limited parts of the microprocessor circuit. In this work very detailed experiments are accomplished by utilizing a complex microprocessor, LEON 3, and injecting millions of faults, both SEUs and SETs in the whole microprocessor circuit.
Keywords :
fault diagnosis; microprocessor chips; radiation hardening (electronics); LEON 3 microprocessor circuit; SET; SEU; fault injection; software-based hardening technique; Benchmark testing; Circuit faults; Clocks; Hardware; Microprocessors; Registers; Software; LEON 3; SET; SEU; error detecríon; fault tolerance; software hardening;
Conference_Titel :
Design of Circuits and Integrated Circuits (DCIS), 2014 Conference on
Conference_Location :
Madrid
DOI :
10.1109/DCIS.2014.7035591
