DocumentCode :
2632641
Title :
A novel phase unwrapping algorithm and its application to phase stepped interferometry
Author :
Younus, Md Iqbal ; Hardie, Russell C. ; Blackshire, James
Author_Institution :
Dept. of Electr. Eng., Dayton Univ., OH, USA
fYear :
1998
fDate :
13-17 Jul 1998
Firstpage :
590
Lastpage :
595
Abstract :
Phase unwrapping is critical in the analysis of phase maps from a variety of interferometric systems. For some methods, an unwrapping error, due to noise, at some point can corrupt all subsequent phase demodulations from the corrupted point on. In images, this tends to lead to erroneous stripes in the phase demodulated data. We propose a novel phase unwrapping approach that uses a spatial binary tree image decomposition to allow maximum parallelism in implementation. At each node in the tree structure, a single unwrapping decision is made between two image blocks. The unwrapping rule used here is derived from a statistical estimate framework. Specifically, a maximum likelihood estimate of the demodulation term is used. This term can be viewed as that which minimizes a discontinuity penalizing cost function. We show that the algorithm exhibits robustness in presence of noise. The algorithm is demonstrated in a phase stepped interferometric system application
Keywords :
demodulation; electronic speckle pattern interferometry; maximum likelihood estimation; optical information processing; optical modulation; phase modulation; demodulation; discontinuity penalizing cost function; image decomposition; maximum likelihood estimate; parallelism; phase demodulation; phase maps; phase stepped interferometry; phase unwrapping; phase unwrapping algorithm; spatial binary tree; statistical estimate; unwrapping decision; unwrapping error; Application software; Computer errors; Demodulation; Educational institutions; Interferometry; Phase measurement; Pressure measurement; Robustness; Telephony; Wrapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location :
Dayton, OH
ISSN :
0547-3578
Print_ISBN :
0-7803-4449-9
Type :
conf
DOI :
10.1109/NAECON.1998.710210
Filename :
710210
Link To Document :
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