Title :
Design of latchup immunity memory cell for Monolithic Active Pixel Sensors
Author :
Wei, Xiuqin ; Gao, Dayong ; Hu, Ya ; Wei, Xiuqin ; Dorokhov, A.
Abstract :
Monolithic Active Pixel Sensors (MAPS) are intended to be used in STAR experiment at relativistic heavy ion collider (RHIC) accelerator for their good performances on particle tracking. Based on commercial CMOS processes, SRAMs built in MAPS are vulnerable to single event latch-up (SEL). Two SEL immunity memory cells are proposed in this paper for construction of radiation tolerant memories. The radiation hard cells have been realized. The tradeoffs among the cell areas and radiation tolerance are significantly considered. The designed cells satisfy the radiation tolerance requirements of STAR experiment. The cell areas are 4.6 × 7.975 μm2 and 4.55 × 5.45 μm2 for 6T and 2T cells respectively in 0.35 μm standard CMOS process. The area of the 6T cell is about 40 % of the area of a radiation tolerant 6T SRAM cell used in previous contribution and the area of the 2T cell is about 26 % of that.
Keywords :
CMOS image sensors; SRAM chips; storage management chips; 6T SRAM cell; MAPS; SEL immunity memory cell; STAR experiment; latchup immunity memory cell; monolithic active pixel sensor; particle tracking; radiation hard cell; radiation tolerance requirement; radiation tolerant memory; relativistic heavy ion collider accelerator; single event latch-up; standard CMOS process; Computer architecture; MOSFETs; Microprocessors; Pixel; Random access memory; Substrates; Memory cell; Particle detection; Radiation hard design; STAR experiment;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8754-7
Electronic_ISBN :
pending
DOI :
10.1109/ICIEA.2011.5975558