Title :
Large-scale DWDM photonic integrated circuits: a manufacturable and scalable integration platform
Author :
Joyner, Charles H. ; Pleumeekers, Jacco L. ; Mathur, Atul ; Evans, Peter W. ; Lambert, Damien J H ; Murthy, Sanjeev ; Mathis, Sheila K. ; Peters, Frank H. ; Baeck, Johan ; Missey, Mark J. ; Dentai, Andrew G. ; Salvatore, Randal A. ; Schneider, Richard P.,
Author_Institution :
Infinera Corp., Sunnyvale, CA
Abstract :
Commercial scaling of electronic integrated circuits has proceeded at a fast pace once the initial hurdle to integration was overcome. Recently, it has been shown that record active and passive optical device counts, exceeding 50 discrete components, can be incorporated onto a single monolithic 100 Gbps DWDM transmitter PIC InP chip. We will investigate key production metrics for this large-scale PIC commercial device as well as other analogs to other III-V semiconductor commercial devices. Using the yield management tools pioneered by silicon based electronics, we will present data supporting their scalability and the manufacturability of these large-scale PICs
Keywords :
III-V semiconductors; indium compounds; integrated optics; integrated optoelectronics; monolithic integrated circuits; optical fibre communication; optical transmitters; wavelength division multiplexing; 100 Gbit/s; DWDM; DWDM transmitter; III-V semiconductor commercial devices; InP; PIC InP chip; PIC commercial device; active optical device counts; commercial scaling; electronic integrated circuits; large-scale photonic integrated circuits; manufacturable integration platform; monolithic transmitter; passive optical device counts; production metrics; scalable integration platform; silicon based electronics; yield management tools; III-V semiconductor materials; Indium phosphide; Integrated circuit manufacture; Large scale integration; Large-scale systems; Optical devices; Optical transmitters; Photonic integrated circuits; Production; Wavelength division multiplexing;
Conference_Titel :
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-9217-5
DOI :
10.1109/LEOS.2005.1548019
