• DocumentCode
    2632915
  • Title

    Development of novel nanomanipulators based on scanning probe microscopes

  • Author

    Iwata, Futoshi

  • Author_Institution
    Fac. of Eng., Shizuoka Univ., Shizuoka, Japan
  • fYear
    2011
  • fDate
    6-9 Nov. 2011
  • Firstpage
    529
  • Lastpage
    529
  • Abstract
    Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM). Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.
  • Keywords
    atomic force microscopy; micromanipulators; nanotechnology; atomic force microscope; haptic control system; high-speed atomic force microscopy; local surface manipulation; nanomanipulators; nanometer scale resolution; nanometer-scale manipulator; real time nanomanipulation system; scanning electron microscope; scanning probe microscopes; surface imaging tools; surface observation; Manipulators; Nanobioscience; Nanoscale devices; Probes; Scanning electron microscopy; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro-NanoMechatronics and Human Science (MHS), 2011 International Symposium on
  • Conference_Location
    Nagoya
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-1360-6
  • Type

    conf

  • DOI
    10.1109/MHS.2011.6102248
  • Filename
    6102248