Title :
Development of novel nanomanipulators based on scanning probe microscopes
Author_Institution :
Fac. of Eng., Shizuoka Univ., Shizuoka, Japan
Abstract :
Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM). Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.
Keywords :
atomic force microscopy; micromanipulators; nanotechnology; atomic force microscope; haptic control system; high-speed atomic force microscopy; local surface manipulation; nanomanipulators; nanometer scale resolution; nanometer-scale manipulator; real time nanomanipulation system; scanning electron microscope; scanning probe microscopes; surface imaging tools; surface observation; Manipulators; Nanobioscience; Nanoscale devices; Probes; Scanning electron microscopy; Surface topography;
Conference_Titel :
Micro-NanoMechatronics and Human Science (MHS), 2011 International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4577-1360-6
DOI :
10.1109/MHS.2011.6102248