DocumentCode
2633076
Title
From RTL to silicon: The case for automated debug
Author
Veneris, Andreas ; Keng, Brian ; Safarpour, Sean
Author_Institution
ECE Dept., Univ. of Toronto, Toronto, ON, Canada
fYear
2011
fDate
25-28 Jan. 2011
Firstpage
306
Lastpage
310
Abstract
Computer-aided design tools are continuously improving their scalability and efficiency to mitigate the high cost associated with designing and fabricating modern VLSI systems. A key step in the design process is the root-cause analysis of detected errors. Debugging may take months to close, introduce high cost and uncertainty ultimately jeopardizing the chip release date. This study makes the case for debug automation in each part of the design flow (RTL to silicon) to bridge the gap. Contemporary research, challenges and future directions motivate for the urgent need in automation to relieve the pain from this highly manual task.
Keywords
VLSI; electronic design automation; RTL; VLSI system; computer-aided design tool; debug automation; root-cause analysis; silicon; Automation; Complexity theory; Debugging; Design automation; Field programmable gate arrays; Integrated circuit modeling; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4244-7515-5
Type
conf
DOI
10.1109/ASPDAC.2011.5722204
Filename
5722204
Link To Document