• DocumentCode
    2633076
  • Title

    From RTL to silicon: The case for automated debug

  • Author

    Veneris, Andreas ; Keng, Brian ; Safarpour, Sean

  • Author_Institution
    ECE Dept., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2011
  • fDate
    25-28 Jan. 2011
  • Firstpage
    306
  • Lastpage
    310
  • Abstract
    Computer-aided design tools are continuously improving their scalability and efficiency to mitigate the high cost associated with designing and fabricating modern VLSI systems. A key step in the design process is the root-cause analysis of detected errors. Debugging may take months to close, introduce high cost and uncertainty ultimately jeopardizing the chip release date. This study makes the case for debug automation in each part of the design flow (RTL to silicon) to bridge the gap. Contemporary research, challenges and future directions motivate for the urgent need in automation to relieve the pain from this highly manual task.
  • Keywords
    VLSI; electronic design automation; RTL; VLSI system; computer-aided design tool; debug automation; root-cause analysis; silicon; Automation; Complexity theory; Debugging; Design automation; Field programmable gate arrays; Integrated circuit modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4244-7515-5
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2011.5722204
  • Filename
    5722204