• DocumentCode
    2633343
  • Title

    SETmap: A soft error tolerant mapping algorithm for FPGA designs with low power

  • Author

    Peng, Chi-Chen ; Dong, Chen ; Chen, Deming

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Champaign, IL, USA
  • fYear
    2011
  • fDate
    25-28 Jan. 2011
  • Firstpage
    388
  • Lastpage
    393
  • Abstract
    Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.
  • Keywords
    SRAM chips; fault tolerant computing; field programmable gate arrays; FPGA circuit; SETmap; SRAM-based FPGA design; chip performance constraint; field programmable gate arrays; power optimization mapping algorithm; soft error tolerant mapping algorithm; technology mapping problem; Cost function; Equations; Field programmable gate arrays; Logic gates; Switches; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4244-7515-5
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2011.5722219
  • Filename
    5722219