DocumentCode
2633343
Title
SETmap: A soft error tolerant mapping algorithm for FPGA designs with low power
Author
Peng, Chi-Chen ; Dong, Chen ; Chen, Deming
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Champaign, IL, USA
fYear
2011
fDate
25-28 Jan. 2011
Firstpage
388
Lastpage
393
Abstract
Field programmable gate arrays (FPGAs) are widely used in VLSI applications due to their flexibility to implement logical functions, fast total turn-around time and low none-recurring engineering cost. SRAM-based FPGAs are the most popular FPGAs in the market. However, as process technologies advance to nanometer-scale regime, the issue of reliability of devices becomes critical. Soft errors are increasingly becoming a reliability concern because of the shrinking process dimensions. In this paper we study the technology mapping problem for FPGA circuits to reduce the occurrence of soft errors under the chip performance constraint and power reduction. Compared to two power-optimization mapping algorithms, SVmap [17] and Emap [15] respectively, we reduce the soft error rate by 40.6% with a 2.22% power overhead and 48.0% with a 2.18% power overhead using 6-LUTs.
Keywords
SRAM chips; fault tolerant computing; field programmable gate arrays; FPGA circuit; SETmap; SRAM-based FPGA design; chip performance constraint; field programmable gate arrays; power optimization mapping algorithm; soft error tolerant mapping algorithm; technology mapping problem; Cost function; Equations; Field programmable gate arrays; Logic gates; Switches; Table lookup;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4244-7515-5
Type
conf
DOI
10.1109/ASPDAC.2011.5722219
Filename
5722219
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