Title :
Scattering Parameter Measurement Techniques in Microstrip
Author :
Schallenberg, J.L. ; Beal, J.C.
Author_Institution :
Queen´´s Univ., Kingston, ON, Canada
Abstract :
Measurements are made on microstrip waveguides with coaxial-to-microstrip wave transitions, by means of a sliding obstacle method, and S-parameters of the transitions and the microstrip are derived for a range of frequencies from 1 to 11 GHz.
Keywords :
microstrip lines; S-parameters; coaxial-to-microstrip wave transition; microstrip waveguides; scattering parameter measurement technique; sliding obstacle method; Coaxial cables; Coaxial components; Frequency measurement; Impedance; Integrated circuit interconnections; Measurement techniques; Microstrip components; Microwave devices; Scattering parameters; Waveguide transitions;
Conference_Titel :
Microwave Symposium, 1972 IEEE GMTT International
Conference_Location :
Arlington Heights, IL
DOI :
10.1109/GMTT.1972.1122981
