Title :
Microwave Measurements with Active Systems
Author :
Ajmera, Ramesh C. ; Batchelor, Donald B. ; Lashinsky, Herbert
Author_Institution :
East Carolina Univ., Greenville, NC, USA
Abstract :
A new system for microwave dielectric measurements is described. The system with sample comprises a microwave oscillator whose frequency and amplitude provide the desired information. Preliminary results pertaining to sensitivity, dynamic range and time resolution are presented.
Keywords :
dielectric measurement; microwave measurement; microwave oscillators; active systems; dynamic range; microwave dielectric measurements; microwave oscillator; time resolution; Cavity resonators; Dielectric constant; Dielectric measurements; Displacement measurement; Frequency measurement; Mechanical variables measurement; Microwave measurements; Microwave oscillators; Phase measurement; Time measurement;
Conference_Titel :
Microwave Symposium, 1972 IEEE GMTT International
Conference_Location :
Arlington Heights, IL
DOI :
10.1109/GMTT.1972.1122983
