• DocumentCode
    2633449
  • Title

    Microwave Measurements with Active Systems

  • Author

    Ajmera, Ramesh C. ; Batchelor, Donald B. ; Lashinsky, Herbert

  • Author_Institution
    East Carolina Univ., Greenville, NC, USA
  • fYear
    1972
  • fDate
    22-24 May 1972
  • Firstpage
    33
  • Lastpage
    35
  • Abstract
    A new system for microwave dielectric measurements is described. The system with sample comprises a microwave oscillator whose frequency and amplitude provide the desired information. Preliminary results pertaining to sensitivity, dynamic range and time resolution are presented.
  • Keywords
    dielectric measurement; microwave measurement; microwave oscillators; active systems; dynamic range; microwave dielectric measurements; microwave oscillator; time resolution; Cavity resonators; Dielectric constant; Dielectric measurements; Displacement measurement; Frequency measurement; Mechanical variables measurement; Microwave measurements; Microwave oscillators; Phase measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 1972 IEEE GMTT International
  • Conference_Location
    Arlington Heights, IL
  • Type

    conf

  • DOI
    10.1109/GMTT.1972.1122983
  • Filename
    1122983