• DocumentCode
    2633730
  • Title

    Technology scaling and soft error reliability

  • Author

    Massengill, Lloyd W. ; Bhuva, Bharat L. ; Holman, W. Timothy ; Alles, Michael L. ; Loveless, T. Daniel

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • fYear
    2012
  • fDate
    15-19 April 2012
  • Abstract
    This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
  • Keywords
    failure analysis; integrated circuit reliability; radiation hardening (electronics); integrated circuit scaling; radiation soft error failure modes; soft error reliability; technology scaling; CMOS integrated circuits; CMOS technology; Inverters; Logic gates; MOS devices; Sensitivity; Switches; SER; radiation effects; single event effect; soft error; soft error reliability; technology scaling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4577-1678-2
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2012.6241810
  • Filename
    6241810
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2633730