Title :
Technology scaling and soft error reliability
Author :
Massengill, Lloyd W. ; Bhuva, Bharat L. ; Holman, W. Timothy ; Alles, Michael L. ; Loveless, T. Daniel
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
This paper discusses several attributes of integrated circuit scaling in relation to radiation soft error failure modes and vulnerability.
Keywords :
failure analysis; integrated circuit reliability; radiation hardening (electronics); integrated circuit scaling; radiation soft error failure modes; soft error reliability; technology scaling; CMOS integrated circuits; CMOS technology; Inverters; Logic gates; MOS devices; Sensitivity; Switches; SER; radiation effects; single event effect; soft error; soft error reliability; technology scaling;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2012.6241810
