Title :
Output power characteristics of cooled power PHEMT MMICs
Author :
Sokolov, Vladimir ; Childs, Timothy ; Dwarkin, Robert ; Cheung, Philip
Author_Institution :
TLC Precision Wafer Technol. Inc., Minneapolis, MN, USA
Abstract :
Saturated power output characteristics of monolithic microwave (and mm-wave) integrated circuit (MMIC) power amplifiers incorporating double heterojunction InGaAs-channel PHEMTs (pseudomorphic high electron mobility transistors) operating at different base plate temperatures are compared. While it is generally expected that ideal PHEMTs have greater output power at lower temperatures, it is shown experimentally that this is not always the case. Indeed, the saturated output power does not necessarily follow the same trends with temperature as the corresponding small signal gain characteristics. In some cases the saturated output power is less at lower temperatures despite and increase in the corresponding small signal gain. Furthermore, the same monolithic circuit design may behave differently with temperature depending on the specific PHEMT wafer from which it was fabricated. Guidelines are presented for the selection of suitable PHEMT epitaxial material for increasing saturated output power at lower temperatures
Keywords :
III-V semiconductors; MMIC power amplifiers; gallium arsenide; indium compounds; integrated circuit design; power HEMT; InGaAs; PHEMT wafer; cooled power PHEMT MMIC; double heterojunction InGaAs-channel PHEMT; epitaxial material; monolithic circuit design; monolithic microwave integrated circuit; plate temperatures; power amplifiers; pseudomorphic high electron mobility transistors; saturated output power; saturated power output characteristics; Heterojunctions; High power amplifiers; MMICs; Microwave amplifiers; Microwave integrated circuits; Monolithic integrated circuits; PHEMTs; Power amplifiers; Power generation; Temperature;
Conference_Titel :
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-4449-9
DOI :
10.1109/NAECON.1998.710221