DocumentCode
2633794
Title
Experimental characterization of process corners effect on SRAM alpha and neutron Soft Error Rates
Author
Gasiot, Gilles ; Glorieux, M. ; Uznanski, Slawosz ; Clerc, Sylvain ; Roche, Philippe
Author_Institution
Technol. R&D/Central CAD & Design Solutions, STMicroelectron., Crolles, France
fYear
2012
fDate
15-19 April 2012
Abstract
This paper shows alpha and neutron experimental Soft Error Rate characterization of a SRAM test vehicle processed with different process corners in order to emulate the variability encountered in volume production. It allows assessing large variability effects with few samples that are compatible with accelerated SER testing. This allows investigating the effect of variability in mass-production on soft error rate of deca-nanometric technologies.
Keywords
SRAM chips; radiation hardening (electronics); SER testing; SRAM alpha; SRAM test vehicle; decananometric technologies; mass production; neutron soft error rates; process corners; volume production; Analytical models; Error analysis; Neutrons; Production; Random access memory; Statistical distributions; Voltage measurement; Process corner; Soft Error Rate; alpha and neutron experiments; manufacturing process variability; volume production;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241813
Filename
6241813
Link To Document