Title :
Experimental characterization of process corners effect on SRAM alpha and neutron Soft Error Rates
Author :
Gasiot, Gilles ; Glorieux, M. ; Uznanski, Slawosz ; Clerc, Sylvain ; Roche, Philippe
Author_Institution :
Technol. R&D/Central CAD & Design Solutions, STMicroelectron., Crolles, France
Abstract :
This paper shows alpha and neutron experimental Soft Error Rate characterization of a SRAM test vehicle processed with different process corners in order to emulate the variability encountered in volume production. It allows assessing large variability effects with few samples that are compatible with accelerated SER testing. This allows investigating the effect of variability in mass-production on soft error rate of deca-nanometric technologies.
Keywords :
SRAM chips; radiation hardening (electronics); SER testing; SRAM alpha; SRAM test vehicle; decananometric technologies; mass production; neutron soft error rates; process corners; volume production; Analytical models; Error analysis; Neutrons; Production; Random access memory; Statistical distributions; Voltage measurement; Process corner; Soft Error Rate; alpha and neutron experiments; manufacturing process variability; volume production;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2012.6241813
