Title :
25th IEEE VLSI Test Symmposium - Title page
Abstract :
The following topics are dealt with: delay test quality; memory testing; online testing; ATPG for delay faults; fault prediction and evaluation; analog test; fault tolerant nanoscale architectures; mixed signal testing; SOC testing; and design for test
Keywords :
automatic test pattern generation; delays; design for testability; fault tolerance; integrated memory circuits; mixed analogue-digital integrated circuits; system-on-chip; ATPG; analog test; automatic test pattern generation; delay faults; delay test quality; design for test; fault prediction; fault tolerance; memory test; mixed signal testing; online test; system-on-chip;
Conference_Titel :
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-2812-0
