DocumentCode
2633959
Title
Layout sensitivities of transient external latchup
Author
Kripanidhi, Arjun ; Rosenbaum, Elyse
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2012
fDate
15-19 April 2012
Abstract
The trigger current for external latchup depends on the duration of the triggering event. A physics-based model is provided to capture the effects of aggressor to victim spacing and orientation on transient triggering of external latchup. The latchup susceptibility of standard cell based designs is also investigated.
Keywords
circuit layout; integrated circuit design; trigger circuits; aggressor; latchup susceptibility; layout sensitivity; physics-based model; standard cell based design; transient external latchup; transient triggering; trigger current; victim spacing; Anodes; Cathodes; Current measurement; Layout; Standards; Temperature measurement; Transient analysis; Latchup; PNPN; Transient External Latchup;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location
Anaheim, CA
ISSN
1541-7026
Print_ISBN
978-1-4577-1678-2
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2012.6241821
Filename
6241821
Link To Document