DocumentCode
2633995
Title
Test Technology Technical Council (TTTC)
fYear
2007
fDate
39203
Keywords
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2007. 25th IEEE
Conference_Location
Berkeley, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-2812-0
Type
conf
DOI
10.1109/VTS.2007.81
Filename
4209880
Link To Document