Scaled CMOS reliability and considerations for spacecraft systems: Bottom-up and top-down perspectives

Author

White, Mark

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

2012

fDate

15-19 April 2012

Abstract

The recently launched Mars Science Laboratory (MSL) flagship mission, named Curiosity, is the most complex rover ever built by NASA and is scheduled to touch down on the red planet in August, 2012 in Gale Crater. The rover and its instruments will have to endure the harsh environments of the surface of Mars to fulfill its main science objectives. Such complex systems require reliable microelectronic components coupled with adequate component and system-level design margins. Reliability aspects of these elements of the spacecraft system are presented from bottom-up and top-down perspectives.

Keywords

CMOS integrated circuits; avionics; integrated circuit design; integrated circuit reliability; planetary rovers; space vehicles; Curiosity; Gale Crater; Mars Science Laboratory flagship mission; NASA; bottom-up perspective; microelectronic component reliability; rover; scaled CMOS reliability; spacecraft system; system-level design margin; top-down perspective; CMOS integrated circuits; Mars; Performance evaluation; Power system reliability; Reliability engineering; Space vehicles; Scaled CMOS; component reliability; derating; spacecraft systems; thermal margin;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium (IRPS), 2012 IEEE International

Conference_Location

Anaheim, CA

ISSN

1541-7026

Print_ISBN

978-1-4577-1678-2

Electronic_ISBN

1541-7026

Type

conf

DOI

10.1109/IRPS.2012.6241833

Filename

6241833