Title :
Scaled CMOS reliability and considerations for spacecraft systems: Bottom-up and top-down perspectives
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The recently launched Mars Science Laboratory (MSL) flagship mission, named Curiosity, is the most complex rover ever built by NASA and is scheduled to touch down on the red planet in August, 2012 in Gale Crater. The rover and its instruments will have to endure the harsh environments of the surface of Mars to fulfill its main science objectives. Such complex systems require reliable microelectronic components coupled with adequate component and system-level design margins. Reliability aspects of these elements of the spacecraft system are presented from bottom-up and top-down perspectives.
Keywords :
CMOS integrated circuits; avionics; integrated circuit design; integrated circuit reliability; planetary rovers; space vehicles; Curiosity; Gale Crater; Mars Science Laboratory flagship mission; NASA; bottom-up perspective; microelectronic component reliability; rover; scaled CMOS reliability; spacecraft system; system-level design margin; top-down perspective; CMOS integrated circuits; Mars; Performance evaluation; Power system reliability; Reliability engineering; Space vehicles; Scaled CMOS; component reliability; derating; spacecraft systems; thermal margin;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2012.6241833
