Title :
A review of real-time soft-error rate measurements in electronic circuits
Author :
Autran, J.L. ; Munteanu, D. ; Serre, S. ; Sauze, S.
Author_Institution :
IM2NP Inst., Aix-Marseille Univ., Marseille, France
Abstract :
The real-time (or life testing) soft-error rate (SER) measurement is an experimental reliability technique to determine the SER from the monitoring of a population of devices subjected to the natural radiation environment and operating under nominal conditions. This review presentation gives a survey over different real-time SER experiments conducted in altitude and/or underground over the past decade. We discuss the specific advantages and limitations of this approach as well as its comparison with accelerated tests using intense particle beams or sources.
Keywords :
integrated circuit testing; life testing; radiation hardening (electronics); accelerated tests; electronic circuits; intense particle beams; life testing; natural radiation environment; real-time SER experiments; real-time SER measurement; real-time soft-error rate measurements; CMOS integrated circuits; Life estimation; Neutrons; Random access memory; Real time systems; Reliability; Testing; SRAM; altitude; atmospheric neutrons; life testing; multiple cell upset; real-time testing; single-event upset; soft-error rate; undergound;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4577-1678-2
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2012.6241843