• DocumentCode
    2634365
  • Title

    Piezoelectricity of ZnO and its nanostructures

  • Author

    Kou, Liang-zhi ; Guo, Wan-lin ; Li, Chun

  • Author_Institution
    Inst. of Nano Sci., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing
  • fYear
    2008
  • fDate
    5-8 Dec. 2008
  • Firstpage
    354
  • Lastpage
    359
  • Abstract
    The wurtzite ZnO material exhibits excellent piezoelectric property along the [0001]-direction because of the noncentrosymmetric structure. As a typical II-VI wide band gap compound, it has been long studied as a piezoelectric material. Here we review the previous theoretical and experimental researches on the piezoelectric properties of ZnO and its nanostructures. Some practical applications in nanodevices are also exhibited. The present review could serve as a good reference for future investigations in the relative fields, and also indicates potential applications in nanoscale devices. Our contributions on this review topic are focused on the theoretical investigations of piezoelectricity of ZnO nanostructures, including nanowires and nanofilms, by using first-principles calculations. For the nanowires, size-dependent axial piezoelectricity in [0001]-oriented ZnO nanowires with diameters ranging from 0.4 to 3.0 nm is investigated. It is shown that the effective piezoelectric constant e33 of the nanowires increases with increasing diameter, and is approximately one order smaller than the bulk value due to the structural change on the boundary of the nanowires. The absolute value of the axial piezoelectricity induced by the radial strain e31 is around half of the effective e33, which is similar to the bulk case. For the ZnO nanofilms, we find that the effective piezoelectric constant e33 of ZnO nanofilms is also size dependent, and increases with increasing thickness in the nanoscale simulated in our work. When the film thickness is larger than 2.4 nm, the corresponding piezoelectric coefficient becomes higher than that of bulk ZnO. The enhancement over the bulk value reaches 11% when the film thickness is 2.9 nm.
  • Keywords
    II-VI semiconductors; ab initio calculations; nanowires; piezoelectric semiconductors; piezoelectricity; reviews; semiconductor thin films; wide band gap semiconductors; zinc compounds; II-VI wide band gap compound; ZnO; first-principles calculations; nanofilms; nanostructures; nanowires; piezoelectric constant; piezoelectric material; piezoelectricity; radial strain; review; size 2.9 nm; wurtzite material; Capacitive sensors; Nanoscale devices; Nanostructured materials; Nanostructures; Nanowires; Piezoelectric films; Piezoelectric materials; Piezoelectricity; Wideband; Zinc oxide; ZnO; first-principles calculations; nanofilms; nanostructure; nanowires; piezoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Piezoelectricity, Acoustic Waves, and Device Applications, 2008. SPAWDA 2008. Symposium on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-2891-5
  • Type

    conf

  • DOI
    10.1109/SPAWDA.2008.4775808
  • Filename
    4775808